Nano Security: From Nano-Electronics to Secure Systems

Polian, Ilia; Altmann, Frank; Arul, Tolga; Boit, Christian; Brederlow, Ralf; Davi, Lucas; Drechsler, Rolf; Du, Nan; Eisenbarth, Thomas; Güneysu, Tim; Hermann, Sascha; Hiller, Matthias; Leupers, Rainer; Merchant, Farhad; Mussenbrock, Thomas; Katzenbeisser, Stefan; Kumar, Akash; Kunz, Wolfgang; Mikolajick, Thomas; Pachauri, Vivek; Seifert, Jean-Pierre; Torres, Frank Sill; Trommer, Jens

Piscataway, NJ : IEEE (2021)
Contribution to a book, Contribution to a conference proceedings (Plenary/Keynote)

In: [Design, Automation & Test in Europe Conference & Exhibition, 2021-02-01 - 2021-02-05, Grenoble, France]
Page(s)/Article-Nr.: 1334-1339

Identifier